CASE STUDY

HP

30% Better Yields, 40% Fewer Defects: HP's Data-Driven Success Story (Free Download)

Hewlett Packard, or HP, lacked central visibility in its chip production area. These chips were tracked over 60 unique data points, ensuring the highest quality standards. 

Obtaining clear insights into chip yield (quantity) and yield quality became complex.

Mactores became their trusted partner, helping them navigate the complexities of data management.

Our collaboration with HP yielded impressive results:

30% Improved Yield Prediction
40% Reduction in Post-Manufacturing Defects
Enhanced Control over Manufacturing Operations

Want to know how Mactores did it?

Download our FREE case study to learn!